[ESD Assoc Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 - Anaheim, CA, USA (26-28 Sept. 2000)] Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476) - ESD-level circuit simulation-impact of gate RC-delay on HBM and CDM behavior
Mergens, M.P.J., Wilkening, W., Kiesewetter, G., Mettler, S., Wolf, H., Hieber, J., Fichtner, W.Année:
2000
Langue:
english
DOI:
10.1109/eosesd.2000.890115
Fichier:
PDF, 916 KB
english, 2000