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Contrast enhancement on crystalline silicon in polarized reflection mode tip-enhanced Raman spectroscopy
Quang Nguyen, Razvigor Ossikovski, Joachim SchreiberVolume:
274
Année:
2007
Langue:
english
Pages:
5
DOI:
10.1016/j.optcom.2007.01.057
Fichier:
PDF, 316 KB
english, 2007