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[IEEE 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Hsinchu, Taiwan (2014.4.28-2014.4.30)] Proceedings of Technical Program - 2014 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) - Advanced CMOS reliability challenges
Prasad, ChetanAnnée:
2014
Langue:
english
DOI:
10.1109/vlsi-tsa.2014.6839637
Fichier:
PDF, 875 KB
english, 2014