[IEEE 2014 International Symposium on Next-Generation Electronics (ISNE) - Kwei-Shan Tao-Yuan, Taiwan (2014.5.7-2014.5.10)] 2014 International Symposium on Next-Generation Electronics (ISNE) - Robust design of HV pLDMOS-ESCR structures in a 60-V BCD process
Chen, Shen-Li, Lee, Min-Hua, Lin, Chun-Ju, Lai, Yi-Sheng, Chang, Shawn, Huang, Yu-TingAnnée:
2014
Langue:
english
DOI:
10.1109/isne.2014.6839325
Fichier:
PDF, 408 KB
english, 2014