[IEEE International Test Conference 2004 - Charlotte, NC, USA (26-28 Oct. 2004)] 2004 International Conferce on Test - Simulation requirements for vectors in ATE formats
Raghuraman, R.Année:
2004
Langue:
english
DOI:
10.1109/test.2004.1387384
Fichier:
PDF, 785 KB
english, 2004