[IEEE 2007 IEEE International Conference on Integrated Circuit Design and Technology - Austin, TX, USA (2007.05.30-2007.06.1)] 2007 IEEE International Conference on Integrated Circuit Design and Technology - Effects of Drift-Region Design on the Reliability of Integrated High-Voltage LDMOS Transistors
Chen, Jone F., Chen, Shiang-Yu, Tian, Kuen-Shiuan, Wu, Kuo-Ming, Su, Yan-Kuin, Liu, C. M., Hsu, S. L.Année:
2007
Langue:
english
DOI:
10.1109/icicdt.2007.4299554
Fichier:
PDF, 1.98 MB
english, 2007