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[IEEE 2012 4th IEEE International Memory Workshop (IMW) - Milan, Italy (2012.05.20-2012.05.23)] 2012 4th IEEE International Memory Workshop - Scaling Challenges for the Cross-Point Resistive Memory Array to Sub-10nm Node - An Interconnect Perspective
Liang, Jiale, Yeh, Stanley, Wong, S. Simon, Wong, H.-S. PhilipAnnée:
2012
Langue:
english
DOI:
10.1109/imw.2012.6213650
Fichier:
PDF, 294 KB
english, 2012