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[IEEE 2010 IEEE 34th Annual Computer Software and Applications Conference Workshops (COMPSACW) - Seoul, Korea (South) (2010.07.19-2010.07.23)] 2010 IEEE 34th Annual Computer Software and Applications Conference Workshops - Supporting Concern-Based Regression Testing and Prioritization in a Model-Driven Environment
Filho, Roberto S. Silva, Budnik, Christof J., Hasling, William M., McKenna, Monica, Subramanyan, RajeshAnnée:
2010
Langue:
english
DOI:
10.1109/compsacw.2010.63
Fichier:
PDF, 570 KB
english, 2010