[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Leveraging existing power control circuits and power delivery architecture for variability measurement
Acharyya, Dhruva, Agarwal, Kanak, Plusquellic, JimAnnée:
2010
Langue:
english
DOI:
10.1109/test.2010.5699268
Fichier:
PDF, 1.83 MB
english, 2010