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[Japan Soc. Appl. Phys 2003 Symposium on VLSI Circuits. Digest of Technical Papers - Kyoto, Japan (12-14 June 2003)] 2003 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.03CH37408) - Charge-transferred presensing and efficiently precharged negative word-line schemes for low-voltage DRAMs
Jae-Yoon Sim,, Young-Gu Gang,, Kyu-Nam Lim,, Joong-Yong Choi,, Sang-Keun Kwak,, Ki-Chul Chun,, Jei-Hwan Yoo,, Dong-Il Seo,, Soo-In Cho,Année:
2003
Langue:
english
DOI:
10.1109/VLSIC.2003.1221230
Fichier:
PDF, 304 KB
english, 2003