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[IEEE 2009 11th Electronics Packaging Technology Conference (EPTC) - Singapore, Singapore (2009.12.9-2009.12.11)] 2009 11th Electronics Packaging Technology Conference - Improvement of drop shock and TC reliability for large die Wafer Level Packages in mobile application
Lee, Jun-Kyu, Park, Yun-Mook, Kang, In-Soo, Kwon, Yong-Min, Paik, Kyung-WookAnnée:
2009
Langue:
english
DOI:
10.1109/eptc.2009.5416464
Fichier:
PDF, 1.92 MB
english, 2009