A Novel Semianalytical Approach for Finding Pull-In Voltages of Micro Cantilever Beams Subjected to Electrostatic Loads and Residual Stress Gradients
Ou, Kuang-Shun, Chen, Kuo-Shen, Yang, Tian-Shiang, Lee, Sen-YungVolume:
20
Langue:
english
Journal:
Journal of Microelectromechanical Systems
DOI:
10.1109/jmems.2011.2105246
Date:
April, 2011
Fichier:
PDF, 1.06 MB
english, 2011