Injection of point defects during annealing of low energy As implanted silicon
C. Tsamis, D. Skarlatos, V. Valamontes, D. Tsoukalas, G. BenAssayag, A. Claverie, W. LerchVolume:
124-125
Année:
2005
Langue:
english
Pages:
5
DOI:
10.1016/j.mseb.2005.08.123
Fichier:
PDF, 223 KB
english, 2005