[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Reliability enhancement using in-field monitoring and recovery for RF circuits
Chang, Doohwang, Ozev, Sule, Bakkaloglu, Bertan, Kiaei, Sayfe, Afacan, Engin, Dundar, GunhanAnnée:
2014
Langue:
english
DOI:
10.1109/vts.2014.6818774
Fichier:
PDF, 831 KB
english, 2014