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[IEEE 55th ARFTG Conference Digest - Boston, MA, USA (2000.06.15-2000.06.16)] 55th ARFTG Conference Digest - Measurement driven models of nonlinear electronic components
Tufillaro, Nicholas, Usikov, Daniel, Barford, Lee, Walker, David M., Schreurs, DominiqueAnnée:
2000
Langue:
english
DOI:
10.1109/ARFTG.2000.327396
Fichier:
PDF, 352 KB
english, 2000