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[IEEE VTC-2005-Fall. 2005 IEEE 62nd Vehicular Technology Conference, 2005. - Dallas, TX, USA (25-28 Sept., 2005)] VTC-2005-Fall. 2005 IEEE 62nd Vehicular Technology Conference, 2005. - A distributed approach to contour line extraction using sensor networks
Pei-Kai Liao,, Min-Kuan Chang,, C.-C. Jay Kuo,Volume:
4
Année:
2005
Langue:
english
DOI:
10.1109/vetecf.2005.1559042
Fichier:
PDF, 1.41 MB
english, 2005