[IEEE 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Phoenix, AZ, USA (2007.04.15-2007.04.19)] 2007 IEEE International Reliability Physics Symposium Proceedings. 45th Annual - Effect of Interface Buffer Layer on the Reliability of Ultra-Thin MgO Magnetic Tunnel Junctions for Spin Transfer Switching MRAM
Hosotani, Keiji, Asao, Yoshiaki, Nagamine, Makoto, Ueda, Tomomasa, Aikawa, Hisanori, Shimomura, Naoharu, Ikegawa, Sumio, Kajiyama, Takeshi, Takahashi, Shigeki, Nitayama, Akihiro, Yoda, HiroakiAnnée:
2007
Langue:
english
DOI:
10.1109/relphy.2007.369995
Fichier:
PDF, 489 KB
english, 2007