
[IEEE IC's (ISPSD) - San Diego, CA, USA (2011.05.23-2011.05.26)] 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and ICs - High-voltage thick layer SOI technology for PDP scan driver IC
Qiao, Ming, Jiang, Lingli, Wang, Meng, Huang, Yong, Liao, Hong, Liang, Tao, Sun, Zhen, Zhang, Bo, Li, Zhaoji, Huang, Guangzuo, Zhao, Yuanyuan, Lai, Li, Hu, Xi, Zhuang, Xiang, Luo, Xiaorong, Wang, ZhuoAnnée:
2011
Langue:
english
DOI:
10.1109/ispsd.2011.5890820
Fichier:
PDF, 1.74 MB
english, 2011