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[IEEE 2010 76th ARFTG Microwave Measurement Conference - Clearwater Beach, FL, USA (2010.11.30-2010.12.3)] 2010 76th ARFTG Microwave Measurement Conference - Calibration accuracy of a 625 GHz on-wafer probe
Reck, Theodore J., Chen, Lihan, Zhang, Chunhu, Arsenovic, Alex, Lichtenberger, Arthur, Weikle, Robert M., Barker, N. ScottAnnée:
2010
Langue:
english
DOI:
10.1109/arftg76.2010.5700054
Fichier:
PDF, 724 KB
english, 2010