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[IEEE 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop - Monterey, CA, USA (2007.08.26-2007.08.30)] 2007 22nd IEEE Non-Volatile Semiconductor Memory Workshop - New Punch-through Assisted Hot Holes Programming Mechanism for Reliable SONOS FLASH Memories with Thick Tunnel Oxide
Akil, N., van Duuren, M., Golubovic, D.S., Boutchich, M., van Schaijk, R.Année:
2007
Langue:
english
DOI:
10.1109/nvsmw.2007.4290595
Fichier:
PDF, 366 KB
english, 2007