Application of Machine Model ESD tester to high volume capacitor reliability testing
Michael G. Meeder, Leslie Marchut, Michael J. Antonell, Michael T. Fresina, Christopher E. Novak, Terry C. DarcheVolume:
51
Année:
2011
Langue:
english
Pages:
6
DOI:
10.1016/j.microrel.2010.09.026
Fichier:
PDF, 1.26 MB
english, 2011