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A surface potential and quasi-Fermi potential based drain current model for pocket-implanted MOS transistors in subthreshold regime
S. BaishyaVolume:
49
Année:
2009
Langue:
english
Pages:
8
DOI:
10.1016/j.microrel.2009.05.001
Fichier:
PDF, 1.05 MB
english, 2009