IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2012 / 12 Vol. 31; Iss. 12
Efficient SRAM Failure Rate Prediction via Gibbs Sampling
Sun, Shupeng, Feng, Yamei, Dong, Changdao, Li, XinVolume:
31
Langue:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2012.2209884
Date:
December, 2012
Fichier:
PDF, 6.02 MB
english, 2012