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[IEEE IEEE Custom Integrated Circuits Conference - CICC '93 - San Diego, CA, USA (9-12 May 1993)] Proceedings of IEEE Custom Integrated Circuits Conference - CICC '93 - SYSCHECK: A user-programmable mixed-mode verification tool
Hinners, M., Meixenberger, C., Astier, L., Degrauwe, M.Année:
1993
Langue:
english
DOI:
10.1109/cicc.1993.590709
Fichier:
PDF, 378 KB
english, 1993