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Performance and reliability of ultra-thin oxide nMOSFETs under variable body bias
F. Crupi, L. Magnelli, P. Falbo, M. Lanuzza, M. Nafría, R. RodríguezVolume:
84
Année:
2007
Langue:
english
Pages:
4
DOI:
10.1016/j.mee.2007.04.015
Fichier:
PDF, 336 KB
english, 2007