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[IEEE 2012 4th Electronic System-Integration Technology Conference (ESTC) - Amsterdam, Netherlands (2012.09.17-2012.09.20)] 2012 4th Electronic System-Integration Technology Conference - Numerical simulation and experimental verification of copper plating with different additives for through silicon vias
Song, Chongshen, Wu, Heng, Jing, Xiangmeng, Dai, Fengwei, Yu, Daquan, Wan, LixiAnnée:
2012
Langue:
english
DOI:
10.1109/estc.2012.6542054
Fichier:
PDF, 2.84 MB
english, 2012