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[IEEE 2008 11th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS) - Bratislava, Slovakia (2008.04.16-2008.04.18)] 2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems - SoCECT: System on Chip Embedded Core Test
Higgins, Michael, MacNamee, Ciaran, Mullane, BrendanAnnée:
2008
Langue:
english
DOI:
10.1109/ddecs.2008.4538811
Fichier:
PDF, 6.69 MB
english, 2008