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[IEEE 2000 International Semiconducting and Insulating Materials Conference. SIMC-XI - Canberra, ACT, Australia (3-7 July 2000)] 2000 International Semiconducting and Insulating Materials Conference. SIMC-XI (Cat. No.00CH37046) - Defect engineering in MBE grown GaAs based materials
Specht, P., Cich, M.J., Zhao, R., Jager, N.D., Gebauer, J., Borner, F., Krause-Rehberg, R., Luysberg, M., Weber, E.R.Année:
2000
Langue:
english
DOI:
10.1109/sim.2000.939200
Fichier:
PDF, 283 KB
english, 2000