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[IEEE 2002 IEEE 18th International Semiconductor Laser Conference. Conference Digest - Garmisch, Germany (29 Sept.-3 Oct. 2002)] IEEE 18th International Semiconductor Laser Conference - Reliability proving of 980 nm pump lasers for metro applications
Arlt, S., Pfeiffer, H.-U., Jung, I.D., Jakubowicz, A., Schwarz, M., Matuschek, N., Pliska, T., Schmidt, B., Mohrdiek, S., Harder, C.S.Année:
2002
Langue:
english
DOI:
10.1109/islc.2002.1041169
Fichier:
PDF, 146 KB
english, 2002