On the advantages of the use of the three-element detector system for measuring EDXRD patterns to follow the crystallisation of open-framework structures
Muncaster, Gavin, Davies, Andrew T., Sankar, Gopinathan, Richard A. Catlow, C., Meurig Thomas, John, Colston, Sally L., Barnes, Paul, Walton, Richard I., O'Hare, DermotVolume:
2
Année:
2000
Langue:
english
Journal:
Physical Chemistry Chemical Physics
DOI:
10.1039/b004171h
Fichier:
PDF, 158 KB
english, 2000