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An FRAM-Based Nonvolatile Logic MCU SoC Exhibiting 100% Digital State Retention at ${\rm VDD}=$ 0 V Achieving Zero Leakage With ${
Khanna, Sudhanshu, Bartling, Steven C., Clinton, Michael, Summerfelt, Scott, Rodriguez, John A., McAdams, Hugh P.Volume:
49
Langue:
english
Journal:
IEEE Journal of Solid-State Circuits
DOI:
10.1109/jssc.2013.2284367
Date:
January, 2014
Fichier:
PDF, 2.32 MB
english, 2014