[IEEE 2012 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu (2012.04.23-2012.04.25)] Proceedings of Technical Program of 2012 VLSI Design, Automation and Test - Embedded SRAM ring oscillator for in-situ measurement of NBTI and PBTI degradation in CMOS 6T SRAM array
Ming-Chien Tsai,, Yi-Wei Lin,, Hao-I Yang,, Ming-Hsien Tu,, Wei-Chiang Shih,, Nan-Chun Lien,, Kuen-Di Lee,, Shyh-Jye Jou,, Ching-Te Chuang,, Wei Hwang,Année:
2012
Langue:
english
DOI:
10.1109/vlsi-dat.2012.6212587
Fichier:
PDF, 504 KB
english, 2012
File converter
Plus de résultats de recherche
More benefits 
