[IEEE 2011 23rd International Conference on Microelectronics (ICM) - Hammamet, Tunisia (2011.12.19-2011.12.22)] ICM 2011 Proceeding - TSV model linearization
Salah, Khaled, Rouby, Alaa El, Ragai, Hani, Ismail, YeheaAnnée:
2011
Langue:
english
DOI:
10.1109/icm.2011.6177394
Fichier:
PDF, 705 KB
english, 2011