[IEEE 2010 12th Electronics Packaging Technology Conference - (EPTC 2010) - Singapore, Singapore (2010.12.8-2010.12.10)] 2010 12th Electronics Packaging Technology Conference - Analysis of electromigration for Cu pillar bump in flip chip package
Jae-Hyouk Yoo,, In-Soo Kang,, Gi-Jo Jung,, Sungdong Kim,, Hyo-Sok Ahn,, Won-Ho Choi,, Ki-Sung Jun,, Doo-Wool Jang,, In-Hong Baek,, Joo-Nam Yu,Année:
2010
Langue:
english
DOI:
10.1109/eptc.2010.5702620
Fichier:
PDF, 1.38 MB
english, 2010