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[IEEE 2008 International Conference on Microelectronics - ICM - Sharjah, United Arab Emirates (2008.12.14-2008.12.17)] 2008 International Conference on Microelectronics - Nanoscale SOI MOSFETs with double step buried oxide: A novel structure for suppressed self-heating effects
Heydari, Sara, Orouji, Ali A., Fathipour, MortezaAnnée:
2008
Langue:
english
DOI:
10.1109/icm.2008.5393504
Fichier:
PDF, 281 KB
english, 2008