Electron beam lithographically-defined scanning electrochemical-atomic force microscopy probes: fabrication method and application to high resolution imaging on heterogeneously active surfaces
Dobson, Phillip S., Weaver, John M. R., Burt, David P., Holder, Mark N., Wilson, Neil R., Unwin, Patrick R., Macpherson, Julie V.Volume:
8
Année:
2006
Langue:
english
Journal:
Physical Chemistry Chemical Physics
DOI:
10.1039/b605828k
Fichier:
PDF, 692 KB
english, 2006