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[IEEE Computer Society Press 1993 European Conference on Design Automation with the European Event in ASIC Design - Paris, France (22-25 Feb. 1993)] 1993 European Conference on Design Automation with the European Event in ASIC Design - Multiple observation time single reference test generation using synchronizing sequences
Hyunwoo Cho,, Seh-Woong Jeong,, Somenzi, F., Pixley, C.Année:
1993
Langue:
english
DOI:
10.1109/edac.1993.386426
Fichier:
PDF, 558 KB
english, 1993