[IEEE 56th Annual Device Research Conference Digest - Charlottesville, VA, USA (22-24 June 1998)] 56th Annual Device Research Conference Digest (Cat. No.98TH8373) - High-voltage accumulation-layer UMOSFETs in 4H-SiC
Tan, J., Cooper, J.A., Melloch, M.R.Année:
1998
Langue:
english
DOI:
10.1109/drc.1998.731133
Fichier:
PDF, 806 KB
english, 1998