[IEEE 2011 IEEE International Conference on RFID-Technologies and Applications (RFID-TA) - Sitges, Spain (2011.09.15-2011.09.16)] 2011 IEEE International Conference on RFID-Technologies and Applications - RFID testing and evaluation for an RF-harsh environment
Mercer, Allison J., James, Ryan K., Bennett, Gisele, Patel, Priyank, Johnston, Chase, Cai, JamesAnnée:
2011
Langue:
english
DOI:
10.1109/rfid-ta.2011.6068622
Fichier:
PDF, 954 KB
english, 2011