[IEEE 2014 19th IEEE European Test Symposium (ETS) - Paderborn, Germany (2014.5.26-2014.5.30)] 2014 19th IEEE European Test Symposium (ETS) - Reducing embedded software radiation-induced failures through cache memories
Santini, Thiago, Rech, Paolo, Nazar, Gabriel, Carro, Luigi, Wagner, Flavio RechAnnée:
2014
Langue:
english
DOI:
10.1109/ets.2014.6847793
Fichier:
PDF, 396 KB
english, 2014