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[IEEE 2009 International Workshop on Intelligent Systems and Applications - Wuhan, China (2009.05.23-2009.05.24)] 2009 International Workshop on Intelligent Systems and Applications - BN Approach for Dimensional Variation Diagnosis in Assembly Process
Liu, Yinhua, Jin, SunAnnée:
2009
Langue:
english
DOI:
10.1109/iwisa.2009.5072768
Fichier:
PDF, 479 KB
english, 2009