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Surface state capture cross sections at Si/electrolyte interfaces determined by combined microwave reflection/photocurrent measurements
W�nsch, Frank, Alonso-Vante, Nicolas, Tributsch, HelmutVolume:
5
Année:
2003
Langue:
english
Journal:
Physical Chemistry Chemical Physics
DOI:
10.1039/b304547c
Fichier:
PDF, 131 KB
english, 2003