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[IEEE 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops (CVPR Workshops) - Anchorage, AK, USA (2008.06.23-2008.06.28)] 2008 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops - Stratified regularity measures with Jensen-Shannon divergence
Kazunori Okada,, Periaswamy, Senthil, Jinbo Bi,Année:
2008
Langue:
english
DOI:
10.1109/cvprw.2008.4563020
Fichier:
PDF, 546 KB
english, 2008