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[IEEE Microsystems (ASDAM) - Smolenice, Slovakia (2010.10.25-2010.10.27)] The Eighth International Conference on Advanced Semiconductor Devices and Microsystems - The compound oxides based on TiO2 and NiO thin films for low temperature gas detection
Kosc, I., Hotovy, I., Kompitsas, M., Grieseler, R., Wilke, M, Rehacek, V., Predanocy, M., Kups, T., Spiess, L.Année:
2010
Langue:
english
DOI:
10.1109/asdam.2010.5666355
Fichier:
PDF, 406 KB
english, 2010