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Characterization and Modeling of Breakdown Probability in Sub-Micrometer CMOS SPADs
Pancheri, Lucio, Stoppa, David, Dalla Betta, Gian-FrancoVolume:
20
Langue:
english
Journal:
IEEE Journal of Selected Topics in Quantum Electronics
DOI:
10.1109/jstqe.2014.2327791
Date:
November, 2014
Fichier:
PDF, 1.24 MB
english, 2014