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[IEEE 2008 International Conference on Embedded Software and Systems - Chengdu, SiChuan, China (2008.07.29-2008.07.31)] 2008 International Conference on Embedded Software and Systems - Performance Testing Based on Time Complexity Analysis for Embedded Software
Jin, Hu, Chen, Liang-Yin, Zeng, Ling-Ming, Li, Bao-LinAnnée:
2008
Langue:
english
DOI:
10.1109/ICESS.2008.90
Fichier:
PDF, 254 KB
english, 2008