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Electrostatic field limits and charge threshold for field-induced damage to voltage susceptible devices
Jaakko Paasi, Hannu Salmela, Jeremy SmallwoodVolume:
64
Année:
2006
Langue:
english
Pages:
9
DOI:
10.1016/j.elstat.2005.03.089
Fichier:
PDF, 208 KB
english, 2006