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Study of thermal oxidation of LaSix/Si(1 0 0) by grazing incidence electron-induced X-ray emission spectroscopy
T. Kashiwakura, S. NakaiVolume:
135
Année:
2004
Langue:
english
Pages:
6
DOI:
10.1016/j.elspec.2004.01.002
Fichier:
PDF, 121 KB
english, 2004