Analysis of triple phase contact in Ni–YSZ microstructures using non-destructive X-ray tomography with synchrotron radiation
P.R. Shearing, J. Gelb, J. Yi, W.-K. Lee, M. Drakopolous, N.P. BrandonVolume:
12
Année:
2010
Langue:
english
Pages:
4
DOI:
10.1016/j.elecom.2010.05.014
Fichier:
PDF, 646 KB
english, 2010