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Defect structure of HgCdTe films grown by molecular beam epitaxy on Si substrates
Izhnin, I I, Izhnin, A I, Savytskyy, H V, Vakiv, M M, Stakhira, Y M, Fitsych, O E, Yakushev, M V, Sorochkin, A V, Sabinina, I V, Dvoretsky, S A, Sidorov, Yu G, Varavin, V S, Pociask-Bialy, M, Mynbaev,Volume:
27
Langue:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/27/3/035001
Date:
March, 2012
Fichier:
PDF, 383 KB
english, 2012